WAFER PROBING MEASUREMENTS OF ITkPix-V1 FOR ITk PIXEL ATLAS UPGRADE
| dc.contributor.author | Salahat, Hosnia | |
| dc.date.accessioned | 2024-07-25T11:09:17Z | |
| dc.date.available | 2024-07-25T11:09:17Z | |
| dc.date.issued | 2024-07-22 | |
| dc.description.abstract | This thesis is related to a Toroidal LHC Apparatus (ATLAS), the biggest general-purpose detector at the Large Hadron collider (LHC). Inside the LHC ring, two high energy hadron beams collide. This collision needs to be detected to check the predictions of particle physics theories, such as the properties of the Higgs boson, which is so crucial to the Standard Model. For that, ATLAS and other detectors were built. Researchers need to boost the LHC's performance by increasing its integrated luminosity by a factor of ten beyond its design value to maximize discoveries possibility in 2029, known as the High Luminosity-Large Hadron Collider (HL-LHC) plan. ATLAS detector is going under upgrading processes to cope with this higher luminosity, in which its inner detector (ID) that is composed partially of silicon is going to be replaced by a new inner tracker (ITk) consists completely of silicon. The new ITk is composed of a strip detector and pixel detector. The building blocks of the ITk’s pixel detector are the pixel modules which contains readout chips called the ITkPix-V1. Those chips are going under tests to check its suitability to be used in the new ITk. One of those tests is the wafer probing tests. In Laboratoire De Physique Des 2 Infinite Irène Joliot-Curie (IJCLab), the wafer propping set-up used for this task has to undergo a quality control process to decide its fit to do the tests on the chips, so the main topic of this thesis is analyzing the results of the tests done by the wafer probing set-up of IJCLab on the ITkPix-V1 chips and comparing it to reference measurements done by the University of Bonn on the same chips in order to help qualifying the set-up of IJCLab to do the wafer probing tests. Part of the test results were similar to the reference results while some were not. Depending on the analysis done, some reasons that cause the non consistent results were found. Key Words: ATLAS, LHC, HL-LHC, ITk, ITkPix-V1. | |
| dc.identifier.citation | Hosnia, S. (2024).WAFER PROBING MEASUREMENTS OF ITkPix-V1 FOR ITk PIXEL ATLAS UPGRADE. An-Najah National University | |
| dc.identifier.uri | https://hdl.handle.net/20.500.11888/19211 | |
| dc.language.iso | en | |
| dc.publisher | An-Najah National University | |
| dc.supervisor | Bassalat, Ahmed | |
| dc.title | WAFER PROBING MEASUREMENTS OF ITkPix-V1 FOR ITk PIXEL ATLAS UPGRADE | |
| dc.type | Thesis |